Spectrometru cu fluorescenta cu raze X TXRF si EDXRF – GNR TX 2000
TX 2000 is the state of the art laboratory spectrometer for quantitative multi element trace analysis using principles of Total Reflection X-Ray Fluorescence (TXRF).
TXRF, based on the same principles of traditional X-Ray Fluorescence (XRF), minimizes or totally eliminates matrix effect, allows simoultaneius multi-element ultra-trace analysis and pushes the instrumental detection limit down to ppb range from sodium to plutonium.
TX 2000, equipped with an automatic primary beam switching system (MoKa, WLa/Lb and bremsstrahlung 33 keV), a Silicon Drift Detector and an high power X-Ray Tube is the optimal solution for applications in environmentalm chemicals and nuclear fields.
TX 2000 Main Features
- TXRF and EDXRF (traditional 45° geometry) spectroscopy in the same equipment.
- Stepper motors with optical encoders ensure extremely precise angular values.
- Automatic switching of primary beam (MoKa, WLa/Lb and bremsstrahlung 33 keV) using double anode Mo/W X-ray tube, based on innovative software. We select the energy required using an high reflectivity 80% (WLa/Lb/MoKa) multilayer. We can choose also other X-ray tubes and monochromatise the energy that you need.
- Peltier-cooled Silicon Drift Detector with an energy resolution of 124eV FWHM@MnKa (shaping time 1 ms)
- Minimal distance between the sample and the detector (mounted to the axis normal to the plane of the sample).
- Instrumental detection limits for more than 50 elements below 10 pg.
- Helium device to improve the detection limits for the light elements.
- Excellent detection limits (ppt) for a wide range element
- No matrix effect
Applications:
- Environmental Analysis: water, dust, sediments, aerosol
- Medicine: toxic elements in biological fluids and tissue samples
- Forensic Science: analysis of extremely small sample quantities
- Pure chemicals: acids, bases, salts, solvents, water, ultrapure reagents
- Oils and greases: crude oil, essential oil, fuel oil
- Pigments: ink, oil paints, powder
- Semiconductor Industry: by VPD (vaporphase decomposition)
- Nuclear Industry: measurements of radioactive elements
| X-Ray Generator | Maximum Output Power | 3 kW (option: 4 kW) | |
| Output Stability | < 0.01 % (for 10% power supply fluctuation) | ||
| Max Output Voltage | 60 kV | ||
| Max Output Current | 60 mA (option: 80 mA) | ||
| Voltage Step Width | 0.1 kV | ||
| Current Step Width | 0.1 mA | ||
| Ripple | 0.03% rms < 1kHz, 0.75% rms > 1kHz | ||
| Preheat and Ramp | Automatic preheat and ramp control circuit | ||
| Input Voltage | 220 Vac +/-10%, 50 or 60 Hz, single phase | ||
| Size | Width 48.3 cm, height 13.3 cm, depth 56 cm | ||
| X-Ray Tube | Type | Glass, Mo/W anode, long fine focus | |
| Focus | 0.4 x 12 mm | ||
| Max Output | 2.5 kW | ||
| Multilayer monochromator | Type | Si/W | |
| Reflectivity | 80% | ||
| Automatic Sample | Sample seating | 12 for TXRF – 1 for EDXRF (45°) | |
| Detector | Type | Peltier-cooled Silicon Drift Detector (SDD) | |
| Active Area | 30 mm2 (10, 50 and 100 as options) | ||
| Energy Resolution | Shaping Time 1 ms | ||
| Preamplifer | Type | Pulsed-reset charge-preamplifer | |
| Case | Dimensions | Width 550 mm, Heigh 1675 mm, Depth 805 mm | |
| Leakage X-Rays | < 1 mSv/Year (full safety shielding according to the international guidelines) | ||
| Processing Unit | Computer Type | Personal Computer | |
| Items Controlled | X-Ray Generator, Tube Shield, Monochromator, Detector, Counting Chain | ||
| Basic Data Processing | Multisample positioning | ||
| Counter Chain parameter settings | |||
| Selection of Radiation | |||
| Centring procedure | |||
| K. L & M markers | |||
| Time or count selection | |||
| Acquisition of data in both geometries (TXRF – EDXRF) | |||
| Least Square Marquardt fit procedure for the area calculation | |||
| Automatic / Manual search Function | |||
| Automatic / Manual Calibration of Energy | |||
| Quantification via an internal standard using theoretical and experimental sensitivity curves for total reflection |
Software:
MODERN SAX – Acquisition Software
Written for Windows 7 is the program designed for the control of the TX 2000 System. It includes some new features, like the batch programming of a set of measurements. The program can control different kinds of detectors and devices attached to the instrument. Control panels for scintillation, linear position sensitive detectors and XRF X-GLAB SDD detector are integrated.
SINERX – Analytical Software
- Least square Marquardt fit procedure for the area calculation (spectral analysis)
- Automatic/manual search function
- Manual or automatic calibration of energy.
- Quantification via an internal standard using theoretical and experimental sensibility curves for total reflection.
