Computer CT
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MetrologyNew X-ray CT system with enhanced inspection and double productivity Nikon XT H 225 ST 2x
The XT H 225/320 LC features a more powerful microfocus X-ray source that is able to run highly accurate inspection on dense industrial objects.
(0 reviews)
MetrologyIndustrial Computed Tomography Nikon XT H 320 for X-ray and CT inspection of larger samples
The XT H 225/320 LC features a more powerful microfocus X-ray source that is able to run highly accurate inspection on dense industrial objects.
(0 reviews)
