Benchtop Scanning Electron Microscope Neoscope SEM JCM 7000

Benchtop Scanning Electron Microscope Neoscope SEM JCM 7000

The SEM 7000 Electron Microscope – has advanced automated functions, along with benchtop automation and software allow easy imaging of elemental analysis samples for all users of all experience levels.

It provides real-time 3D imaging because it is equipped with a high-resolution digital camera and secondary and retrospective electron detectors (SED and BSED) and is considered a SMART-FLEXIBLE-STRONG device.

Strengths

SMART – The latest innovations are incorporated into the bench platform to make SEM accessible to all. All controls are at the user’s fingertips through an intuitive software interface. Automatic condition setting is based on sample type and application for imaging in minutes. Seamless navigation from media chart or optical image (optional) to high-resolution SEM image enhances productivity.

FLEXIBLE – Choose the right platform. Add options such as step navigation system (color camera), motorized tilt-rotate stand for sample handling, fully embedded EDS for elemental analysis, and Smile View Map for 3D image reconstruction and surface texture analysis.

POWERFUL – High-resolution tungsten (W) filament source enables magnification up to 100,000X. Large analytical camera can handle samples up to 80 mm (D) x 50 mm (H). Secondary and backscatter electron detectors, along with high and low vacuum modes of operation, allow a wide variety of sample types to be studied.

 Technical specifications Neoscope SEM 7000

• Zoom: 10x – 100.000x
• Display zoom: 24x – 202.168 x
• Observation mode: High vacuum/ Low vacuum
• Accelerating voltage: 5KV, 10KV, 15KV
• Electron source: Tungsten filament / Wehnelt
• XY travel (motorized): x=40 mm, y= 40 mm
• Maximum part dimensions: 80mm (D) x 50mm (H)
• SEM 7000 unit dimensions: 324 mm (W) x 586 mm (D) x 566 mm (H)
• SEM unit weight: 67 kg
• Document format: BMP, TIFF, JPEG, PNG
• Computer: Desktop PC, Windows 10
• Monitor: 24 inch.