Computed Tomography Software X.Tend - Higher resolution and faster CT
X.Tend – Higher resolution and faster: X.Tend your CT scanning capability
In comparison to conventional circular CT scanning, X.Tend is a CT acquisition method that allows customers to extend the height of their CT scan by moving the tall sample up through the X-ray cone-beam as the sample rotates. X.Tend eliminates the need to have partial scans of a sample that are stitched back together afterwards.
Benefits
- Faster acquisition & processing
- Faster than several circular scans at same magnification
- Easier to mount the sample
- Improved image quality
- No cone beam artefact (better results on horizontal surfaces)
- No ring artefact
- No stitching artefact
- Increased resolution
- Sample doesn’t have to fit in single image
- Scanning tall samples at high magnification
Benefits & features
X.Tend doubles the speed of the CT process for taller samples
Scanning tall parts often causes a dilemma: scan the full part with lower magnification or scan sections of the sample at high resolution and stitch them back together with analysis software. In the first case, you will have lower resolution, losing some detail in the data, and in the latter it will take much longer to scan, reconstruct and stitch back together; with visible stitching artefacts in the final data. X.Tend eliminates the need to have partial scans of a sample that are stitched back together afterwards. Also the parts are easier to mount as they move vertically through the X-ray beam. This halves the total sample processing time, while providing better image quality.
A better insight with improved image quality
X.Tend improves the image quality of CT scans by removing cone beam artefacts, ring artefacts and stitching artefacts, all of which would be present during a circular scan. X.Tend also enables the user to scan a part close to the X-ray source, resulting in higher resolution voxel size. The new X.Tend technique results in clearer, easy-to-interpret images and leaves no doubt in defect recognition, ultimately leading to faster decision making or corrective actions.
