Metrology
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Electronic Microscopes (SEM)Benchtop Scanning Electron Microscope Neoscope SEM JCM 7000
Benchtop Scanning Electron Microscope Neoscope SEM JCM 7000
The SEM 7000 Electron Microscope – has advanced automated functions, along with benchtop automation and software allow easy imaging of elemental analysis samples for all users of all experience levels.
It provides real-time 3D imaging because it is equipped with a high-resolution digital camera and secondary and retrospective electron detectors (SED and BSED) and is considered a SMART-FLEXIBLE-STRONG device.
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