Eclipse L300N Series – FPD/LSI inspection microscopes
Featuring Nikon’s most advanced optics for unparalleled inspection of the latest wafer types.
Nikon Eclipse L300N/L300ND / Wafer Inspection microscopes incorporate Nikon’s renowned CFI60 infinity optics, offering the world’s highest level of optical performance. The enhanced epi-fluorescence function, which enables 365nm UV excitation, is optimal for the inspection of semiconductor resist residues on 300mm wafers and organic electroluminescence displays.
Epi-fluorescence Observation
The L300N/L300ND features powerful epi-fluorescence observation capabilities, widening the inspection range– including 365 nm excitation. Diascopic illumination and various observation methods such as brightfield, darkfield, simple polarizing, and DIC are also possible. This observation versatility is highly beneficial in inspection of semiconductor resist residues and organic electroluminescence displays.
Four Times Brighter than Conventional Diascopic Observation
The L300ND employs a new light source and advanced optics to provide four times brighter illumination for Diascopic observation.
High-intensity 12V-50W Halogen Illuminator
The new high-intensity 12V-50W halogen illuminator is brighter than that of a standard 12V-100W illuminator.
Motorized Universal Nosepiece
The new motorized universal nosepiece is three times more durable than conventional models.
Antistatic Coatings for Stronger Safeguards Against Contamination
Antistatic coatings have been applied to the body, stage, eyepiece tube and other various controls. These coatings strengthen safeguards against contamination and help prevent damage to samples caused by electrostatic charges, thus contributing to higher yields.
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Eclipse L300N Series – FPD/LSI inspection microscopes
Featuring Nikon’s most advanced optics for unparalleled inspection of the latest wafer types.
Nikon Eclipse L300N/L300ND / Wafer Inspection microscopes incorporate Nikon’s renowned CFI60 infinity optics, offering the world’s highest level of optical performance. The enhanced epi-fluorescence function, which enables 365nm UV excitation, is optimal for the inspection of semiconductor resist residues on 300mm wafers and organic electroluminescence displays.
Epi-fluorescence Observation
The L300N/L300ND features powerful epi-fluorescence observation capabilities, widening the inspection range– including 365 nm excitation. Diascopic illumination and various observation methods such as brightfield, darkfield, simple polarizing, and DIC are also possible. This observation versatility is highly beneficial in inspection of semiconductor resist residues and organic electroluminescence displays.
Four Times Brighter than Conventional Diascopic Observation
The L300ND employs a new light source and advanced optics to provide four times brighter illumination for Diascopic observation.
High-intensity 12V-50W Halogen Illuminator
The new high-intensity 12V-50W halogen illuminator is brighter than that of a standard 12V-100W illuminator.
Motorized Universal Nosepiece
The new motorized universal nosepiece is three times more durable than conventional models.
Antistatic Coatings for Stronger Safeguards Against Contamination
Antistatic coatings have been applied to the body, stage, eyepiece tube and other various controls. These coatings strengthen safeguards against contamination and help prevent damage to samples caused by electrostatic charges, thus contributing to higher yields.
Financing solutions for the purchase of new equipment, through BCR Leasing or Grenke.
See Financing MethodsNikon Eclipse Microscope L300N - Specifications | Main body : motorized control for nosepiece , light intensity control, aperture diaphragm control ; |
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Nikon Eclipse Microscope L300ND - Specifications | Main body : motorized control for nosepiece , light intensity control, aperture diaphragm control ; |