Electronic Microscopes (SEM)
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- Electronic Microscopes (SEM)
Microscop SEM Nikon JCM 6000 Plus
The JEOL NeoScope JCM-6000Plus is a scanning electron microscope (SEM) capable of meeting the diverse needs of users. In addition to conventional SEMs that take up too much space, the JCM-6000Plus is a benchtop microscope measuring 330mm (W) x 490mm (D) x 430mm (H). Thanks to this small size it is considered one of the most compact SEMs available on the market.
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Benchtop Scanning Electron Microscope Neoscope SEM JCM 7000
Benchtop Scanning Electron Microscope Neoscope SEM JCM 7000
The SEM 7000 Electron Microscope – has advanced automated functions, along with benchtop automation and software allow easy imaging of elemental analysis samples for all users of all experience levels.
It provides real-time 3D imaging because it is equipped with a high-resolution digital camera and secondary and retrospective electron detectors (SED and BSED) and is considered a SMART-FLEXIBLE-STRONG device.
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