Microscop SEM Nikon JCM 6000 Plus
Microscop SEM Nikon JCM 6000 Plus
The JEOL NeoScope JCM-6000Plus is a scanning electron microscope (SEM) capable of meeting the diverse needs of users. In addition to conventional SEMs that take up too much space, the JCM-6000Plus is a benchtop microscope measuring 330mm (W) x 490mm (D) x 430mm (H). Thanks to this small size it is considered one of the most compact SEMs available on the market.
The microscope features an easy-to-use and intuitive multi-touch screen controller that performs automatic functions such as auto focus, auto stigmator, auto contrast/ brightness. The controller offers the possibility to display two images (one live and one reference) for comparison purposes.
The SEM microscope series continues to feature functionalities such as: a high vacuum level and secondary electron detector providing the ability to clearly observe fine structures on the sample surface at close range.
Technical features
- Zoom 10x – 60.000x
- Analysis type – qualitative and quantitative
- Observation type – High vacuum / Low vacuum
- Accelerating voltage – Secondary electrons: 5KV, 10KV, 15KV;
- Blackscattered electrons: 10KV, 15KV;
- XY stroke – 35 x 35 (Manual / Motorized);
- Table tilt – from -15 ͦ to +45 ͦ Motorized 360 ͦ rotation;
- Maximum part dimensions – 70mm diameter x 50mm height;
- EDS – Yes;
- Pre-centred filament (operator change).
The JEOL JCM-6000 Plus equipment can be used in a wide range of applications as follows:
- medical industry
- automotive industry
- aerospace industry
- metallurgical industry
- electronics industry.
