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      Nikon Eclipse LV150N

      Digital imaging combined with advanced optical system

       

      A manual, nosepiece type microscope which meets the various needs of observation, inspection, research and analysis across a wide range of industrial fields. Higher NA and a longer working distance than ever before means superior optical performance and efficient digital imaging.

      Max. sample size: 150 x 150 mm.

      Microscope type

      • Dedicated reflected illumination models
      • Manual type
       

      Modularized microscope body applicable with various observations and tasks

      Compatible with brightfield, darkfield, simple polarizing, DIC, epifluorescence and two-beam interferometry observations.
      It supports diverse and advanced research, analysis and inspection.

      Compatible observation methods:

      LV150N Compatible observation methods
       

      Compatible stages

      • LV-S32 3×2 stage (Stroke: 75 x 50 mm with glass plate)
        *Can be fitted with LV-S32SPL ESD plate
      •  LV-S6 6×6 stage (Stroke: 150 x 150 mm) 
        *Can be fi tted with LV-S6WH wafer holder / LV-S6PL ESD plate
      • LV-SRP P revolving stage
      • P-GS2 G stage 2 (Used with stage adapter LV-SAD)
       

      Newly developed CFI60-2 series

      Newly developed CFI60-2 series provides the ultimate in long working distance levels and the most advanced chromatic aberration in a light weight body

      CFI60-2 series offers higher NA and longer working distances than ever before.

      Description

      Digital imaging combined with advanced optical system

       

      A manual, nosepiece type microscope which meets the various needs of observation, inspection, research and analysis across a wide range of industrial fields. Higher NA and a longer working distance than ever before means superior optical performance and efficient digital imaging.

      Max. sample size: 150 x 150 mm.

      Microscope type

      • Dedicated reflected illumination models
      • Manual type
       

      Modularized microscope body applicable with various observations and tasks

      Compatible with brightfield, darkfield, simple polarizing, DIC, epifluorescence and two-beam interferometry observations.
      It supports diverse and advanced research, analysis and inspection.

      Compatible observation methods:

      LV150N Compatible observation methods
       

      Compatible stages

      • LV-S32 3×2 stage (Stroke: 75 x 50 mm with glass plate)
        *Can be fitted with LV-S32SPL ESD plate
      •  LV-S6 6×6 stage (Stroke: 150 x 150 mm) 
        *Can be fi tted with LV-S6WH wafer holder / LV-S6PL ESD plate
      • LV-SRP P revolving stage
      • P-GS2 G stage 2 (Used with stage adapter LV-SAD)
       

      Newly developed CFI60-2 series

      Newly developed CFI60-2 series provides the ultimate in long working distance levels and the most advanced chromatic aberration in a light weight body

      CFI60-2 series offers higher NA and longer working distances than ever before.

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      Nikon Eclipse LV150N

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      Funding

      Financing solutions for the purchase of new equipment, through BCR Leasing or Grenke.

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